Optical Instrument--Opto-Edu (Beijing) Co., Ltd. (CNOEC)

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Ion Sputtering Coater

Scanning Electron Microscope Pro FEG SEM

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Scanning Electron Microscope Std SEM

Scanning Electron Microscope Eco SEM

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A63.7062

Scanning Electron Microscope Eco SEM

Features:

Detail Specification:

A63.7062 Eco Tungsten Filament SEM
Resolution		4.5nm@30KV(SE); 6nm@30KV(BSE)
Magnification		Negative Magnification: 15x~250000x; Screen Magnification: 30x~500000x
Electron Gun		Tungsten Heated Cathode-Pre Centered Tungsten Filament Cartridge
Accelerating Voltage		0~30KV
Lens System		Three-level Electromagnetic Lens (Tapered Lens)
Objective Aperture		Molybdenum Aperture Adjustable Outside Vacuum System
Specimen Stage		Five Axes Stage
Travel Range	X(Auto)	0~50mm
	Y(Auto)	0~50mm
	Z(Manual)	0~25mm
	R(Manual)	360o
	T(Manual)	-5o~90o
Max Specimen Diameter		150mm
Detector		High Vacuum Secondary Electron Detector (With Detector Protection)
Modification		Stage Upgrade;EBL;STM;AFM;Heating Stage;Cryo Stage;Tensile Stage;Micro-nano Manipulator;SEM+Coating Machine;SEM+Laser
Accessories		CCD,LaB6,X-Ray Detector(EDS),EBSD,CL,WDS,Coating Machine
Vacuum System		Turbo Molecular Pumps;Rotation Pump
Electron Beam Current		10pAt~0.1μA
PC		Customized Dell Work Station

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