Leading Supplier of Optical & Educational from China About Us Contact Us
ID    PW      New Register    Forget Password
        
 
A62.4503
Atomic Force Microscope
 
A62.4501
Atomic Force Microscope
 
A62.4701
Scanning Probe Microscope
 
A61.4701
Scanning Tunneling Microscope
 
A61.4601
Scanning Tunneling Microscope
 
A61.4501
Scanning Tunnel Microscope
Home >> Optical Instrument >> Scanning Probe Microscope >> Scanning Probe Microscope

A62.4503 Atomic Force Microscope
click to see big img
 
  Features:
1. All-in-one design, smart structure and shape.
2. Scan head and sample stage are designed together, strong anti-vibration performance.
3. Precision laser detection and probe alignment device make laser adjustment simple and easy.
4. Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning area positioning.
5. High-accuracy and large range sample transfer device allow to scan any interesting area of sample.
6. Different types of scanner meets different customer's requirements in accuracy and scan size.
7. optical observation system for tip check and sample positioning.
8. CCD observing system for real-time sample area observing and position.
9. Use servomotor to achieve CCD auto-focusing.
10. Electronic system is designed as modular and easy for maintenance and development.
11. Integrated with many working modes control electronics for further development.

User-friendly software and functions
1. Multi-channels images are capture and display synchronous, observe profile map in real time.
2. Obtain and measure many curves such as F-Z, F-RMS, RMS-Z 3. Execute scan area move and cut function, choose any interesting area of sample.
4. Scan sample in random angle at beginning.
5. Adjust the laser spot detection system in real time.
6. Search the resonance frequency of tip manually or automatically.
7. Choose and set different color of scanning image in palette.
8. Support linear average and offset calibration in real time for sample title.
9. Support scanner sensitivity calibration and electronic controller auto-calibration.
 
  Detail Specification:
A62.4503 Atomic Force Microscope Specification
Operation
modes
Contact mode, Tapping
mode,phase,friction, MFM,EFM
Scan angle 0~360°
Sample size Ø≤90mm,H≤20mm Sample movement 0~20mm
Max. scan
range
X/Y: 50μm, Z: 5μm Pulse width of approaching motor 10±2ms
Resolution X/Y: 0.2 nm, Z: 0.05nm Magnification of CCD Optical magnification:
10X, Resolution 1μm
Scan rate 0.6Hz~4.34Hz Data points 256 x 256,512 x 512
Scanning
control
XY: 18-bit D/A, Z: 16-bit D/A Feedback type DSP digital feedback
Data sampling One 14-bit A/D and double 16-bit A/D multiple-channel simultaneously
  Feedback sampling rate 64.0KHz
Windows USB2.0, Compatible with Windows 98/2000/XP/7/8


 

 
    (C)Copyright by Opto-Edu (Beijing) Co. Ltd. 2002 - 2009                                                          Optical Instrument     Educational Instrument     Why Us?
F-1501 Wanda Plaza, No. 18 Shijingshan Road, Beijing 100043, China | Tel:+86 10 88696020, 88696030 Fax:+86 10 88696085             京ICP备05046616号