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A62.4503
Atomic Force Microscope
 
A62.4501
Atomic Force Microscope
 
A62.4701
Scanning Probe Microscope
 
A61.4701
Scanning Tunneling Microscope
 
A61.4601
Scanning Tunneling Microscope
 
A61.4501
Scanning Tunnel Microscope
Home >> Optical Instrument >> Scanning Probe Microscope >> Scanning Probe Microscope

A61.4601 Scanning Tunneling Microscope
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  Features:
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High Performance
◎ Atomic-scale of resolution
◎ Large sample size
◎ With a DSP inside for great performace
◎ Realtime operating system embedded
◎ Fast Ethernet connection with computer

Multi-function
◎ Scanning Tunnel Microscope (STM)
◎ Curve Analysis: I-V Curve, I-Z Curve
◎ Online rea-time 3D image for better observation.
◎ Multi-channel signals for more sample details.
◎ Trace-Retrace scan, Back-Forward scan.
◎ Multi-Analysis:Granularity and Roughness
◎ Data load-out for further analysis

 
  Detail Specification:
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A61.4601 Specification
Resolution STM:0.13nm Lateral, 0.01nm vertical
X-Y scan scope ~10μm
Z distance ~2μm
Image Pixels: 128x128,256x256,512x512,1024x1024
Scan Angle: 0~360°
Scan Rate: 0.1~100Hz
Sample Size Up to 30mm in diameter, 15mm thick
Engagement Auto engagement with travel distance of 30mm and precision of 50nm
Electronics CPU:32-bit Digital Signal Processor(DSP) at 600MHz from
Texas Instruments.
Fast16-bit DAC
Fast16-bit ADC
High Voltage: 5 channel
Communication interface: 10M/100M Fast Etheret
Software Online Control Software and Offline Image Processing Software for Windows 7/Vista/XP/2000/9x



 

 
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